Monte Carlo modeling for electron microscopy and microanalysis /

Bibliographic Details
Main Author:	Joy, David C., 1943-
Format:	Book
Language:	English
Published:	New York : Oxford University Press, 1995.
Series:	Oxford series in optical and imaging sciences ; 9.
Subjects:	Electron microscopy > Computer simulation. Electron probe microanalysis > Computer simulation. Monte Carlo method.

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