Scanning probe microscopies III : 6-7 February 1995, San Jose, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Vaez-Iravani, Mehdi
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1995]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2384.
Subjects:	Scanning probe microscopy > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2384.toc

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