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IEEE VLSI Test Symposium : digest of papers.

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Bibliographic Details
Previous Title:IEEE VLSI test workshop.
Corporate Authors: IEEE VLSI Test Symposium, Institute of Electrical and Electronics Engineers. Philadelphia Section, IEEE Computer Society. Test Technology Committee, IEEE Test Symposium
Format: Conference Proceeding
Language:English
Published: Atlantic, NJ : IEEE Computer Society, [1990-]
Subjects:
Application-specific integrated circuits > Congresses.
Integrated circuits > Very large scale integration > Testing > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .I225
Notes: Subscription converted to electronic format.
Library Owns: TK7874 .I225 (12th-21st (1994-2003))
Call Number Status Get It
TK7874 .I225 12th 1994 Available
TK7874 .I225 13th 1995 Available
TK7874 .I225 14th 1996 Available
TK7874 .I225 15th 1997 Available
TK7874 .I225 16th 1998 Available
TK7874 .I225 17th 1999 Available
TK7874 .I225 18th 2000 Available
TK7874 .I225 19th 2001 Available
TK7874 .I225 20th 2002 Available
TK7874 .I225 21st 2003 Available