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Proceedings.

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Bibliographic Details
Corporate Authors: Asian Test Symposium, IEEE Computer Society. Test Technology Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1992-]
Subjects:
Electronic digital computers > Circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
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Published 1992
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Conference Proceeding
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