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Bibliographic Details
Corporate Authors: Asian Test Symposium, IEEE Computer Society. Test Technology Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1992-]
Subjects:
Electronic digital computers > Circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Online Availability: Check for online availability

Remote Storage

Holdings details from Remote Storage
Call Number: TK7888.4 .A85
Supplements: 10th:Comendium (2001)
Library Owns: TK7888.4 .A85 (3rd-12th (1994-2003))
Call Number Status Get It
TK7888.4 .A85 3rd 1994 Available
TK7888.4 .A85 4th 1995 Available
TK7888.4 .A85 5th 1996 Available
TK7888.4 .A85 6th 1997 Available
TK7888.4 .A85 7th 1998 Available
TK7888.4 .A85 8th 1999 Available
TK7888.4 .A85 9th 2000 Available
TK7888.4 .A85 10th 2001 Available
TK7888.4 .A85 10th:Compendium 2001 Available
TK7888.4 .A85 11th 2002 Available
TK7888.4 .A85 12th 2003 Available