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Proceedings.

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Bibliographic Details
Corporate Authors: Asian Test Symposium, IEEE Computer Society. Test Technology Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1992-]
Subjects:
Electronic digital computers > Circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Online Availability: Check for online availability
Description
Published:1st (Nov. 26-27, 1992)-
Item Description:Evans description based on: 3rd (1994).
Title from cover.
Physical Description:volumes : illustrations ; 28 cm.
Publication Frequency:Annual
ISSN:1081-7735