Selected papers on scanning probe microscopes : design and applications /

Bibliographic Details

Other Authors:	Martin, Yves, 1959-
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE Optical Engineering Press, [1995]
Series:	SPIE milestone series ; v. MS 107.
Subjects:	Scanning probe microscopy. Scanning tunneling microscopy. Atomic force microscopy.