Proceedings : International Test Conference 1994.

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., Institute of Electrical and Electronics Engineers
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, PA : Piscataway, N.J. : The Conference ; Can be ordered from IEEE Service Center, ©1994.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
Online Access:	IEEE Xplore IEEE Xplore Table of contents

Description
Item Description:	"IEEE catalog number 94CH34835"--Title page verso.
Physical Description:	xii, 1033 pages : illustrations ; 28 cm Also available via the World Wide Web with additional title: Test Conference, 1994, proceedings, International.
Bibliography:	Includes bibliographical references and index.
ISBN:	0780321030 9780780321038 0780321022 9780780321021 0780321049 9780780321045