Proceedings : International Test Conference 1994.

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., Institute of Electrical and Electronics Engineers
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, PA : Piscataway, N.J. : The Conference ; Can be ordered from IEEE Service Center, ©1994.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
Online Access:	IEEE Xplore IEEE Xplore Table of contents

IEEE Xplore
IEEE Xplore
Table of contents

Remote Storage