Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Harding, Kevin G., Stahl, H. Philip
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1995]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2349.
Subjects:	Optical detectors > Industrial applications > Congresses. Interferometry > Industrial applications > Congresses. Quality control > Optical methods > Congresses. Process control > Congresses.

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