Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Svetkoff, Donald J.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1995]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2348.
Subjects:	Computer vision > Congresses. Optical detectors > Congresses. Measurement > Optical methods > Congresses. Interferometry > Congresses. Three-dimensional display systems > Congresses.

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