Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 /

Bibliographic Details
Other Authors:	Ho, P. S., Li, Che-Yu, Totta, Paul
Format:	Book
Language:	English
Published:	New York : American Institute of Physics, [1994]
Series:	AIP conference proceedings ; no. 305.
Subjects:	Semiconductors > Defects > Congresses. Metallic films > Congresses. Thin film devices > Defects > Congresses. Aluminum films > Congresses.

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