Quantitative microscopy and image analysis : conference proceedings /

Bibliographic Details
Corporate Author: International Conference on Quantitative Microscopy and Image Analysis
Other Authors: Diaz, David J.
Format: Conference Proceeding Book
Language:English
Published: Materials Park, OH : ASM International, [1994]
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: Q175 .Q36 1994
 
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Q175 .Q36 1994 Available