Advanced microwave and millimeter-wave detectors : 25-26 July 1994, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Udpa, Satish S., Han, Hsiu C.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1994]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2275.
Subjects:	Microwave detectors > Congresses. Millimeter wave devices > Congresses. Materials > Testing > Congresses. Nondestructive testing > Congresses. Ground penetrating radar > Congresses.

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