Defect recognition and image processing in semiconductors and devices : proceedings of the Fifth International Conference, Santander, Spain, 6-10 September 1993 /

Bibliographic Details
Corporate Author: International Symposium on Defect Recognition and Image Processing in III-V Compounds
Other Authors: Jiménez, J. (Juan)
Format: Conference Proceeding Book
Language:English
Published: Bristol ; Philadelphia : Institute of Physics Publishing, [1994]
Series:Institute of Physics conference series ; no. 135.
Subjects:
Description
Item Description:DRIP conference proceedings.
Physical Description:xx, 417 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0750302941 :