Defect recognition and image processing in semiconductors and devices : proceedings of the Fifth International Conference, Santander, Spain, 6-10 September 1993 /

Bibliographic Details
Corporate Author: International Symposium on Defect Recognition and Image Processing in III-V Compounds
Other Authors: Jiménez, J. (Juan)
Format: Conference Proceeding Book
Language:English
Published: Bristol ; Philadelphia : Institute of Physics Publishing, [1994]
Series:Institute of Physics conference series ; no. 135.
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TK7871.85 .D454 1994
 
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TK7871.85 .D454 1994 Available