Thinning methodologies for pattern recognition /

Bibliographic Details
Other Authors:	Suen, Ching Y., Wang, Patrick S-P. (Patrick Shen-pei)
Format:	Book
Language:	English
Published:	Singapore ; River Edge, NJ : World Scientific, [1994]
Series:	Series in machine perception and artificial intelligence ; v. 8.
Subjects:	Image processing > Digital techniques. Optical pattern recognition. Pattern recognition systems. Parallel processing (Electronic computers) Computer architecture. Algorithms.

Description
Physical Description:	344 pages : illustrations ; 26 cm.
Bibliography:	Includes bibliographical references.
ISBN:	9810214820