Thinning methodologies for pattern recognition /

Bibliographic Details
Other Authors:	Suen, Ching Y., Wang, Patrick S-P. (Patrick Shen-pei)
Format:	Book
Language:	English
Published:	Singapore ; River Edge, NJ : World Scientific, [1994]
Series:	Series in machine perception and artificial intelligence ; v. 8.
Subjects:	Image processing > Digital techniques. Optical pattern recognition. Pattern recognition systems. Parallel processing (Electronic computers) Computer architecture. Algorithms.

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