X-ray and UV detectors : 27-28 July 1994, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Hoover, Richard B., Tate, Mark W.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1994]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2278.
Subjects:	X-rays > Instruments > Congresses. X-ray optics > Congresses. Ultraviolet detectors > Congresses.

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