Han, K., Abu-Amara, H., Colunga, D., & Russell, B. D. (1992). Parallel and intelligent test system architecture for circuit board interconnects.
Chicago Style (17th ed.) CitationHan, Kyongho, Hosame Abu-Amara, Daniel Colunga, and B. Don Russell. Parallel and Intelligent Test System Architecture for Circuit Board Interconnects. 1992.
MLA (9th ed.) CitationHan, Kyongho, et al. Parallel and Intelligent Test System Architecture for Circuit Board Interconnects. 1992.
Warning: These citations may not always be 100% accurate.