Parallel and intelligent test system architecture for circuit board interconnects /

Bibliographic Details
Main Author:	Han, Kyongho, 1959-
Other Authors:	Abu-Amara, Hosame (degree committee member.), Colunga, Daniel (degree committee member.), Russell, B. Don (degree committee member.)
Format:	Thesis Book
Language:	English
Published:	1992.
Subjects:	Electric circuits > Testing. Electric fault location. Major electrical engineering. Academic theses
Online Access:	Link to ProQuest copy Link to OAKTrust copy

Remote Storage

Holdings details from Remote Storage
Call Number	Status	Get It
Call Number:		1992 Dissertation H233
Notes:		Cushing Archival Copy (Library Use Only)

1992 Dissertation H233	Available