APA (7th ed.) Citation

Leblebici, Y., & Kang, S. (1993). Hot-carrier reliability of MOS VLSI circuits. Kluwer Academic.

Chicago Style (17th ed.) Citation

Leblebici, Yusuf, and Sung-Mo Kang. Hot-carrier Reliability of MOS VLSI Circuits. Boston: Kluwer Academic, 1993.

MLA (9th ed.) Citation

Leblebici, Yusuf, and Sung-Mo Kang. Hot-carrier Reliability of MOS VLSI Circuits. Kluwer Academic, 1993.

Warning: These citations may not always be 100% accurate.