Hot-carrier reliability of MOS VLSI circuits /

Bibliographic Details
Main Author:	Leblebici, Yusuf
Other Authors:	Kang, Sung-Mo, 1945-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic, [1993]
Series:	Kluwer international series in engineering and computer science ; SECS 227. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Integrated circuits > Very large scale integration > Defects > Mathematical models. Metal oxide semiconductors > Reliability > Mathematical models. Hot carriers > Reliability > Mathematical models. Integrated circuits

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