Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida /
| Corporate Authors: | , , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1993]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1944. |
| Subjects: |
| Physical Description: | viii, 286 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819411809 (pbk.) |