Integrating photogrammetric techniques with scene analysis and machine vision : 14-15 April 1993, Orlando, Florida /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, United States. Advanced Research Projects Agency, American Society for Photogrammetry and Remote Sensing
Other Authors:	Barrett, Eamon, McKeown, David M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1993]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1944.
Subjects:	Aerial photogrammetry > Congresses. Remote sensing > Congresses. Computer vision > Congresses.

Remote Storage