Cover Image

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors: Thompson, C. V. (Carl V.), Lloyd, J. R. (James R.)
Format: Book
Language:English
Published: Pittsburgh, Penn. : Materials Research Society, [1992]
Series:Materials Research Society symposia proceedings.
Subjects:
Microelectronics > Reliability > Congresses.
Microelectronics > Materials > Testing > Congresses.
Electrodiffusion > Congresses.
Microstructure > Congresses.
Description
Physical Description:ix, 328 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:1558991603
ISSN:0272-9172 ;