Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors:	Thompson, C. V. (Carl V.), Lloyd, J. R. (James R.)
Format:	Book
Language:	English
Published:	Pittsburgh, Penn. : Materials Research Society, [1992]
Series:	Materials Research Society symposia proceedings.
Subjects:	Microelectronics > Reliability > Congresses. Microelectronics > Materials > Testing > Congresses. Electrodiffusion > Congresses. Microstructure > Congresses.

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