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Semiconductor interfaces at the sub-nanometer scale /

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Bibliographic Details
Corporate Authors: North Atlantic Treaty Organization. Scientific Affairs Division, NATO Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Subnanometer Scale
Other Authors: Salemink, H. W. M., Pashley, M. D.
Format: Conference Proceeding Book
Language:English
Published: Dordrecht ; Boston : Kluwer Academic Publishers, [1993]
Series:NATO ASI series. Applied sciences ; no. 243.
Subjects:
Semiconductors > Surfaces > Congresses.
Epitaxy > Congresses.
Nanostructured materials > Congresses.
Semiconductors
Description
Item Description:"Proceedings of the NATO Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Subnanometer Scale, Riva del Garda, Italy, 31 August - 2 September 1992"--Title page verso.
"Published in cooperation with NATO Scientific Affairs Division."
Physical Description:xi, 256 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792323971 (HB : acid free paper)