Semiconductor interfaces at the sub-nanometer scale /

Bibliographic Details
Corporate Authors:	North Atlantic Treaty Organization. Scientific Affairs Division, NATO Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Subnanometer Scale
Other Authors:	Salemink, H. W. M., Pashley, M. D.
Format:	Conference Proceeding Book
Language:	English
Published:	Dordrecht ; Boston : Kluwer Academic Publishers, [1993]
Series:	NATO ASI series. Applied sciences ; no. 243.
Subjects:	Semiconductors > Surfaces > Congresses. Epitaxy > Congresses. Nanostructured materials > Congresses. Semiconductors

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