VLSI fault modeling and testing techniques /

Bibliographic Details
Other Authors:	Zobrist, George W. (George Winston), 1934-
Format:	Book
Language:	English
Published:	Norwood, NJ : Ablex Pub. Corp., [1993]
Series:	VLSI design automation series.
Subjects:	Integrated circuits > Very large scale integration > Testing > Data processing. Fault-tolerant computing.

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