Self-testing VLSI design /

Bibliographic Details
Main Author:	I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Other Authors:	Kachan, I. V.
Format:	Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1993.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design.

Description
Physical Description:	xi, 345 pages : illustrations ; 25 cm.
Bibliography:	Includes bibliographical references (pages 329-341) and index.
ISBN:	0444896406 (alk. paper)