Self-testing VLSI design /

Bibliographic Details
Main Author:	I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Other Authors:	Kachan, I. V.
Format:	Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1993.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design.

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