Optical inspection and testing : proceedings of a conference held 17-18 November 1992, Boston, Massachusetts /
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE Optical Engineering Press,
[1993]
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| Series: | Critical reviews of optical science and technology ;
v. CR46. |
| Subjects: |
Remote Storage
| Call Number: |
TS156.2 .O65 1993 |
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|---|---|---|
| Call Number | Status | Get It |
| TS156.2 .O65 1993 | Available | |