X-ray diffraction at elevated temperatures : a method for in situ process analysis /
| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York, NY :
VCH Publishers,
[1993]
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| Subjects: |
| Physical Description: | 268 pages : illustrations |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0895737450 |