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X-ray diffraction at elevated temperatures : a method for in situ process analysis /

Bibliographic Details
Other Authors: Chung, Deborah D. L.
Format: Book
Language:English
Published: New York, NY : VCH Publishers, [1993]
Subjects:
X-rays > Diffraction.
X-rays > Industrial applications.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC482.D5 X74 1993
 
Call Number Status Get It
QC482.D5 X74 1993 Available