Chung, D. D. L. (1993). X-ray diffraction at elevated temperatures: A method for in situ process analysis. VCH Publishers.
Chicago Style (17th ed.) CitationChung, Deborah D. L. X-ray Diffraction at Elevated Temperatures: A Method for in Situ Process Analysis. New York, NY: VCH Publishers, 1993.
MLA (9th ed.) CitationChung, Deborah D. L. X-ray Diffraction at Elevated Temperatures: A Method for in Situ Process Analysis. VCH Publishers, 1993.
Warning: These citations may not always be 100% accurate.