Machine vision applications in industrial inspection : 3-4 February 1993, San Jose, California /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Wu, Frederick Y., Dawson, Benjamin M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1993]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1907.
Subjects:	Quality control > Optical methods > Automation > Congresses. Computer vision > Congresses.

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