Yield and reliability in microwave circuit and system design /

Bibliographic Details
Main Author:	Meehan, Michael D.
Other Authors:	Purviance, John
Format:	Book
Language:	English
Published:	Boston : Artech House, [1993]
Series:	Artech House microwave library.
Subjects:	Microwave integrated circuits > Design and construction > Statistical methods. Engineering design > Statistical methods. Computer-aided design.

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