Multilayer and grazing incidence x-ray/EUV optics for astronomy and projection lithography : 19-22 July 1992, San Diego, California /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
[1993]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1742. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1742.toc |
Internet
https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1742.tocRemote Storage
| Call Number: |
QC437 .M85 1993 |
|
|---|---|---|
| Call Number | Status | Get It |
| QC437 .M85 1993 | Available | |