Cover Image

Soft X-ray microscopy : 19-21 July 1992, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Jacobsen, Chris J., Trebes, James E.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1993]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1741.
Subjects:
Grenz rays > Congresses.
Microscopy > Congresses.
Imaging systems > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1741.toc
Description
Physical Description:xi, 412 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819409146