Soft X-ray microscopy : 19-21 July 1992, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Jacobsen, Chris J., Trebes, James E.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1993]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1741.
Subjects:	Grenz rays > Congresses. Microscopy > Congresses. Imaging systems > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1741.toc

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