Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. /

Bibliographic Details
Corporate Authors:	Materials Research Society, MRS Symposium on Materials Reliability Issues in Microelectronics
Other Authors:	Lloyd, J. R. (James R.), Yost, Frederick G., Ho, P. S.
Format:	Conference Proceeding Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1991]
Series:	Materials Research Society symposia proceedings.
Subjects:	Microelectronics > Reliability > Congresses. Microelectronics > Materials > Testing > Congresses. Electrodiffusion > Congresses. Microstructure > Congresses.

Description
Item Description:	Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics.
Physical Description:	xiii, 358 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and indexes.
ISBN:	1558991190