Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. /

Bibliographic Details
Corporate Authors:	Materials Research Society, MRS Symposium on Materials Reliability Issues in Microelectronics
Other Authors:	Lloyd, J. R. (James R.), Yost, Frederick G., Ho, P. S.
Format:	Conference Proceeding Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1991]
Series:	Materials Research Society symposia proceedings.
Subjects:	Microelectronics > Reliability > Congresses. Microelectronics > Materials > Testing > Congresses. Electrodiffusion > Congresses. Microstructure > Congresses.

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