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International Test Conference, 1992 : proceedings.

Bibliographic Details
Corporate Authors: International Test Conference Baltimore, Md., Institute of Electrical and Electronics Engineers
Format: Conference Proceeding Book
Language:English
Published: Altoona, PA : Piscataway, NJ : The Conference ; Copies can be ordered from IEEE Service Center, [1992]
Subjects:
Integrated circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:"1992 IEEE International Test Conference"--Cover.
Twenty-third meeting held in Baltimore, Md.
"IEEE catalog number 91-CH3191-4"--Title page verso.
Physical Description:xii, 1012 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818631678 (softbound)
0780307607 (casebound)
081863166X (microfiche)