International Test Conference, 1992 : proceedings.

Bibliographic Details
Corporate Authors:	International Test Conference Baltimore, Md., Institute of Electrical and Electronics Engineers
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, PA : Piscataway, NJ : The Conference ; Copies can be ordered from IEEE Service Center, [1992]
Subjects:	Integrated circuits > Testing > Congresses. Automatic test equipment > Congresses.

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