Interferometry : surface characterization and testing : 24 July 1992, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Creath, Katherine, Greivenkamp, John E.
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE, [1992]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1776.
Subjects:	Interferometry > Congresses. Surfaces (Technology) > Optical properties > Congresses. Surfaces (Technology) > Testing properties > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1776.toc

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