Optically based methods for process analysis : 23-26 March 1992, Somerset, New Jersey /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Rutgers University. Fiber Optics Materials Research Program, New Jersey Commission on Science and Technology
Other Authors:	Bomse, David S.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1992]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1681.
Subjects:	Quality control > Optical methods > Automation > Congresses. Process control > Congresses.

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