Commercial applications of precision manufacturing at the sub-micron level : 19-21 November 1991, London, United Kingdom /

Bibliographic Details
Corporate Authors:	Sira Communications Ltd, American Society for Precision Engineering, Institute of Manufacturing Engineers, Society of Photo-optical Instrumentation Engineers
Other Authors:	Baker, L. R. (Lionel R.)
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1992]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1573.
Subjects:	Manufacturing processes > Quality control > Congresses. Physical measurements > Industrial applications > Congresses.

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