The role of microscopy in semiconductor failure analysis /

Bibliographic Details
Main Author:	Richards, B. P.
Other Authors:	Footner, P. K.
Format:	Book
Language:	English
Published:	Oxford ; New York : Oxford University Press, [1992]
Series:	Microscopy handbooks ; 25.
Subjects:	Semiconductors > Testing. Semiconductors > Failures. Microscopes. Microscopy.

Remote Storage