Test and evaluation of IR detectors and arrays II : 22-23 April 1992, Orlando, Florida /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Hoke, Forney M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1992]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1686.
Subjects:	Infrared detectors > Testing > Congresses. Array processors > Testing > Congresses. Infrared technology > Congresses.

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